NGUYEN, H. T.; LE, V. L.; NGUYEN, T. M.; BUI, X. K.; NGUYEN, T. G.; NGUYEN, N. L. Optical characterization of 2D heterostructure MoS2/WS2 using spectroscopic ellipsometry. Journal of Military Science and Technology, [S. l.], v. 101, n. 101, p. 117–123, 2025. DOI: 10.54939/1859-1043.j.mst.101.2025.117-123. Disponível em: https://ojs.jmst.info/index.php/jmst/article/view/1538. Acesso em: 22 feb. 2025.